Lock-In Thermography System (AISEC-03) - PR868920-3340-P

Description du marché

1 piece Lock-In Thermography System is a non-destructive testing technique used to detect defects in materials, such as composites, semiconductors, and electronic components. It combines thermal imaging with modulated thermal excitation to reveal subsurface anomalies. System Components: - Low-noise MWIR camera with InSb based sensor - Laser scanning microscope (OBIRCH analysis) - Motorized xyz stages - Backside and frontside prober - Control Software: Software to control the modulation of the excitation source, capture thermal images, and analyze data. - Data Analysis Tools: Algorithms to process lock-in data, enhancing signal-to-noise ratio and highlighting defects. Optional Positions: - LIT Base System / Thermal controlled chuck for heating of the device under test (optional) - Laser Scanning Microscope / Solid Immersion Lens (optional) - 3D-Analysis Software (optional) - Thermal Mapping and Thermal Transient Analysis-Software (optional) - Laser marker to assist redetection of POIs (optional)

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