Wafer Prober (IMS-04) - PR899917-2380-P

Description du marché

1 piece wafer prober The IMS requires a wafer prober that enables automated experimental testing of photonic integrated circuits (PIC) and devices at wafer scale. Automated probing is necessary to enable rapid characterization of a large number of PICs and devices with a minimum of human involvement. Options - General System / Semi-automated probing system for 300 mm wafers for electro-optical characterization of photonic integrated circuits Remote interface for setting up and performing measurements / RS-232 and USB 2.0 - Specifications for vacuum wafer chuck and wafer stage Feedback from photodetector to probe positioning system - Automated wafer handler / Wafer ID reader - Software / The software (to control the machine and for analysis) must be archivable and the IMS operator must be able to reinstall the software in case of failure of the operating system or hardware parts of the PC

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